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Filling Pin Holes, Weak Shunts, and Scribe Lines of Photovoltaic Devices
Project ID: D2008-08Background:During the fabrication of semiconductor devices, undesirable and detrimental holes or scribe lines are often created through the layers of the device. These structural defects often expose the transparent conductor layer and when the final metal layer is applied an electrical contact called a shunt is created betwee...